MIL-STD-810F Method 502.4 - Low Temperature

Low temperatures have adverse effects on almost all basic materiel. As a result, exposure of test items to low temperatures may either temporarily or permanently impair the operation of the test item by changing the physical properties of the material composing it. Therefore, low temperature test must be considered whenever the test item will be exposed to temperatures below standard ambient. Examples of some problems that could occur as the result of exposure to cold are:

  1. Hardening and embrittlement of materials.

  2. Binding of parts from differential contraction of dissimilar materials and the different rates of expansion of different parts in response to temperature transients.

  3. Changes in electronic components (resistors, capacitors, etc.).

  4. Stiffening of shock mounts.

  5. Cracking and crazing, embrittlement, change in impact strength, and reduced strength.

  6. Static fatigue of restrained glass.

  7. Condensation and freezing of water.

The TDS Recon is tested to the Basic Cold (C1) standard of one 24-hour cycle at -30 C (-22° F).